JEM-X: The X-ray monitor on INTEGRAL

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedings – Annual report year: 2004Researchpeer-review

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The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).
Original languageEnglish
Title of host publicationX-ray and Gamma-ray Instumentation for Astronomy XIII
EditorsKathryn A Flanagan, Oswald H. W Siegmund
Publication date2004
Pages139-150
ISBN (Print)0-8194-5038-3
DOIs
Publication statusPublished - 2004
EventX-ray and Gamma-ray Instrumentation for Astronomy XIII - San Diego, CA, United States
Duration: 3 Aug 20035 Aug 2003

Conference

ConferenceX-ray and Gamma-ray Instrumentation for Astronomy XIII
CountryUnited States
CitySan Diego, CA
Period03/08/200305/08/2003
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume5165
ISSN0277-786X
CitationsWeb of Science® Times Cited: No match on DOI

    Research areas

  • JEM-X, INTEGRAL, X-ray astronomy, micro strip detector

ID: 2898229