Double phi-Step theta-Scanning Technique for Spherical Near-Field Antenna Measurements: Double ϕ-Step θ-Scanning Technique for Spherical Near-Field Antenna Measurements

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Probe-corrected spherical near-field antenna measurements with an arbitrary probe set certain requirements on an applicable scanning technique. The computational complexity of the general high-order probe correction technique for an arbitrary probe, that is based on the Phi scanning, is O(N4), where N is proportional to the radius of the antenna under test (AUT) minimum sphere in wavelengths. With the present knowledge, the computational complexity of the probe correction for arbitrary probes in the case of the thetas scanning is O(N-6), which is typically not acceptable. This paper documents a specific double Phi-step thetas scanning technique for spherical near-field antenna measurements. This technique not only constitutes an alternative spherical scanning technique, but it also enables formulating an associated probe correction technique for arbitrary probes with the computational complexity of 0(N4) while the possibility for the exploitation of the advantages of the thetas scanning are maintained.
Original languageEnglish
JournalIEEE Transactions on Antennas and Propagation
Issue number6
Pages (from-to)1633-1639
Publication statusPublished - 2008

Bibliographical note

Copyright: 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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    Research areas

  • probe correction, spherical near field, Antenna measurement

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