z calibration of the atomic force microscope by means of a pyramidal tip

    Research output: Contribution to journalJournal articleResearchpeer-review

    285 Downloads (Pure)

    Abstract

    A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.
    Original languageEnglish
    JournalReview of Scientific Instruments
    Volume64
    Issue number9
    Pages (from-to)2595-2597
    ISSN0034-6748
    DOIs
    Publication statusPublished - 1993

    Bibliographical note

    Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

    Keywords

    • RESOLUTION
    • FILMS

    Cite this

    @article{4cc63f3e627544989b800c2321c23505,
    title = "z calibration of the atomic force microscope by means of a pyramidal tip",
    abstract = "A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.",
    keywords = "RESOLUTION, FILMS",
    author = "Flemming Jensen",
    note = "Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics",
    year = "1993",
    doi = "10.1063/1.1143873",
    language = "English",
    volume = "64",
    pages = "2595--2597",
    journal = "Review of Scientific Instruments",
    issn = "0034-6748",
    publisher = "American Institute of Physics",
    number = "9",

    }

    z calibration of the atomic force microscope by means of a pyramidal tip. / Jensen, Flemming.

    In: Review of Scientific Instruments, Vol. 64, No. 9, 1993, p. 2595-2597.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - z calibration of the atomic force microscope by means of a pyramidal tip

    AU - Jensen, Flemming

    N1 - Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

    PY - 1993

    Y1 - 1993

    N2 - A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.

    AB - A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.

    KW - RESOLUTION

    KW - FILMS

    U2 - 10.1063/1.1143873

    DO - 10.1063/1.1143873

    M3 - Journal article

    VL - 64

    SP - 2595

    EP - 2597

    JO - Review of Scientific Instruments

    JF - Review of Scientific Instruments

    SN - 0034-6748

    IS - 9

    ER -