z calibration of the atomic force microscope by means of a pyramidal tip

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    Abstract

    A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.
    Original languageEnglish
    JournalReview of Scientific Instruments
    Volume64
    Issue number9
    Pages (from-to)2595-2597
    ISSN0034-6748
    DOIs
    Publication statusPublished - 1993

    Bibliographical note

    Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

    Keywords

    • RESOLUTION
    • FILMS

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