Abstract
A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope.
Original language | English |
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Journal | Review of Scientific Instruments |
Volume | 64 |
Issue number | 9 |
Pages (from-to) | 2595-2597 |
ISSN | 0034-6748 |
DOIs | |
Publication status | Published - 1993 |
Bibliographical note
Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of PhysicsKeywords
- RESOLUTION
- FILMS