X--ray specular reflectivity study of an n--alkane film dotriacontane, adsorbed on Si (100) substrates

H. Mo, H. Taub, S. N. Ehrlichl, U. G. Volkmann, M. Pino, Flemming Yssing Hansen

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalBulletin American Physical Society
Volume46
Issue number1
Pages (from-to)869
ISSN0003-0503
Publication statusPublished - 2001
Event2001 American Physical Society - Seattle, WA, United States
Duration: 12 Mar 200116 Mar 2001

Conference

Conference2001 American Physical Society
CountryUnited States
CitySeattle, WA
Period12/03/200116/03/2001

Cite this

Mo, H., Taub, H., Ehrlichl, S. N., Volkmann, U. G., Pino, M., & Hansen, F. Y. (2001). X--ray specular reflectivity study of an n--alkane film dotriacontane, adsorbed on Si (100) substrates. Bulletin American Physical Society, 46(1), 869.