@inproceedings{bcc2f3d25b38423084575ac50784debe,
title = "X-ray spectrometry in ESEM and LVSEM: Corrections for beam skirt effects",
keywords = "Industrielle materialer",
author = "J{\o}rgen Bilde-S{\o}rensen and C.C. Appel",
year = "1997",
language = "English",
pages = "12--15",
editor = "A.R. Th{\"o}l{\'e}n",
booktitle = "Proceedings. Forty-ninth annual meeting. The Scandinavian Society for Electron Microscopy",
publisher = "SCANDEM-97",
note = "SCANDEM 97, SCANDEM 97 ; Conference date: 10-06-1997 Through 13-06-1997",
}