X-ray spectrometry in ESEM and LVSEM: Corrections for beam skirt effects

Jørgen Bilde-Sørensen, C.C. Appel

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationProceedings. Forty-ninth annual meeting. The Scandinavian Society for Electron Microscopy
    EditorsA.R. Thölén
    Place of PublicationGöteborg
    PublisherSCANDEM-97
    Publication date1997
    Pages12-15
    Publication statusPublished - 1997
    EventSCANDEM 97 - Göteborg, Sweden
    Duration: 10 Jun 199713 Jun 1997

    Conference

    ConferenceSCANDEM 97
    CountrySweden
    CityGöteborg
    Period10/06/199713/06/1997

    Cite this

    Bilde-Sørensen, J., & Appel, C. C. (1997). X-ray spectrometry in ESEM and LVSEM: Corrections for beam skirt effects. In A. R. Thölén (Ed.), Proceedings. Forty-ninth annual meeting. The Scandinavian Society for Electron Microscopy (pp. 12-15). SCANDEM-97.