X-ray scattering measurements from thin-foil x-ray mirrors

Finn Erland Christensen, BP BYRNAK, Allan Hornstrup, Z SHOUHUA, NJ WESTERGAARD, HW SCHNOPPER, L JALOTA

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Thin foil X-ray mirrors are to be used as the reflecting elements in the telescopes of the X-ray satellites Spectrum-X-Gamma (SRG) and ASTRO-D. High resolution X-ray scattering measurements from the Au coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The X-ray data is compared with laser data and other surface structure data such as STM, atomic force microscopy (AFM), TEM, and electron micrography. The data obtained at Cu K-alpha(1), (8.05 keV) from all the mirrors produced on Al foils shows a scatter which limits the obtainable half-power width to above 1.5 arcmin. Mirrors based on electroformed Ni foils, however, show local regions with a factor of 4 better performance, and they are being developed for future applications.
Original languageEnglish
JournalProceedings of the SPIE - The International Society for Optical Engineering
Volume1546
Number of pages10
ISSN0277-786X
DOIs
Publication statusPublished - 1992
EventMultilayer and Grazing Incidence X-Ray/EUV Optics - San Diego, CA, United States
Duration: 21 Jul 199121 Jul 1991

Conference

ConferenceMultilayer and Grazing Incidence X-Ray/EUV Optics
LocationSan Diego, CA
CountryUnited States
Period21/07/199121/07/1991

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