X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes

A.M. Hussain, Finn Erland Christensen, M.A. Jimenez-Garate, W.W. Craig, C.J. Hailey, T.R. Decker, M. Stern, D.L. Windt, P.H. Mao, F.A. Harrison, G. Pareschi, M.S. del Rio, A. Souvorov, A.K. Freund, R. Tucoulou, A. Madsen, C. Mammen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume3766
Publication date1999
Publication statusPublished - 1999
Event1999 X-Ray Optics, Instruments, and Missions II - Denver, CO, United States
Duration: 18 Jul 199920 Jul 1999

Conference

Conference1999 X-Ray Optics, Instruments, and Missions II
CountryUnited States
CityDenver, CO
Period18/07/199920/07/1999

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