X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes

A.M. Hussain; Finn Erland Christensen; M.A. Jimenez-Garate; W.W. Craig; C.J. Hailey; T.R. Decker; M. Stern; D.L. Windt; P.H. Mao; F.A. Harrison; G. Pareschi; M.S. del Rio; A. Souvorov; A.K. Freund; R. Tucoulou; A. Madsen; C. Mammen

X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes

A.M. Hussain, Finn Erland Christensen, M.A. Jimenez-Garate, W.W. Craig, C.J. Hailey, T.R. Decker, M. Stern, D.L. Windt, P.H. Mao, F.A. Harrison, G. Pareschi, M.S. del Rio, A. Souvorov, A.K. Freund, R. Tucoulou, A. Madsen, C. Mammen

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3766
Publication date	1999
Publication status	Published - 1999
Event	1999 X-Ray Optics, Instruments, and Missions II - Denver, CO, United States Duration: 18 Jul 1999 → 20 Jul 1999

Conference

Conference	1999 X-Ray Optics, Instruments, and Missions II
Country/Territory	United States
City	Denver, CO
Period	18/07/1999 → 20/07/1999

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Hussain, A. M., Christensen, F. E., Jimenez-Garate, M. A., Craig, W. W., Hailey, C. J., Decker, T. R., Stern, M., Windt, D. L., Mao, P. H., Harrison, F. A., Pareschi, G., del Rio, M. S., Souvorov, A., Freund, A. K., Tucoulou, R., Madsen, A., & Mammen, C. (1999). X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3766)

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title = "X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes",

author = "A.M. Hussain and Christensen, {Finn Erland} and M.A. Jimenez-Garate and W.W. Craig and C.J. Hailey and T.R. Decker and M. Stern and D.L. Windt and P.H. Mao and F.A. Harrison and G. Pareschi and {del Rio}, M.S. and A. Souvorov and A.K. Freund and R. Tucoulou and A. Madsen and C. Mammen",

year = "1999",

language = "English",

volume = "3766",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "1999 X-Ray Optics, Instruments, and Missions II ; Conference date: 18-07-1999 Through 20-07-1999",

}

Hussain, AM, Christensen, FE, Jimenez-Garate, MA, Craig, WW, Hailey, CJ, Decker, TR, Stern, M, Windt, DL, Mao, PH, Harrison, FA, Pareschi, G, del Rio, MS, Souvorov, A, Freund, AK, Tucoulou, R, Madsen, A & Mammen, C 1999, X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3766, 1999 X-Ray Optics, Instruments, and Missions II, Denver, CO, United States, 18/07/1999.

X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes. / Hussain, A.M.; Christensen, Finn Erland; Jimenez-Garate, M.A. et al.
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3766 1999.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT and hard X-ray telescopes

AU - Hussain, A.M.

AU - Christensen, Finn Erland

AU - Jimenez-Garate, M.A.

AU - Craig, W.W.

AU - Hailey, C.J.

AU - Decker, T.R.

AU - Stern, M.

AU - Windt, D.L.

AU - Mao, P.H.

AU - Harrison, F.A.

AU - Pareschi, G.

AU - del Rio, M.S.

AU - Souvorov, A.

AU - Freund, A.K.

AU - Tucoulou, R.

AU - Madsen, A.

AU - Mammen, C.

PY - 1999

Y1 - 1999

M3 - Article in proceedings

VL - 3766

BT - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 1999 X-Ray Optics, Instruments, and Missions II

Y2 - 18 July 1999 through 20 July 1999

ER -