X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development

A. Jafari*, F. E. Christensen, S. Massahi, S. Svendsen, L. M. Vu, P. L. Henriksen, B. Shortt, M. Krumrey, L. Cibik, E. Handick, D. D. M. Ferreira

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

113 Downloads (Pure)

Abstract

X-ray reflectivity (XRR) characterization of X-ray mirrors is an essential step for designing space telescopes and instruments. We report on production and characterization of platinum thin films coated onto a at thick glass substrate for evaluating measurement results obtained using several XRR systems. The main objective of this study is to compare the XRR results measured using facilities at the Technical University of Denmark, DTU Space, and BESSY II for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission funded by the European Space Agency, ESA. This sample will be used as a reference sample for testing and calibrating similar measurements at relevant X-ray facilities. This information demonstrates the stable performance of the platinum mirror as a reference sample. Also, the overlayer effect on mirror performance is investigated.
Original languageEnglish
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy IX
EditorsStephen L. O'Dell , Giovanni Pareschi
Volume11119
PublisherSPIE - International Society for Optical Engineering
Publication date2019
Pages111191K-111191K-7
DOIs
Publication statusPublished - 2019
Event2019 SPIE Optical Engineering + Applications - San Diego, United States
Duration: 11 Aug 201915 Aug 2019

Conference

Conference2019 SPIE Optical Engineering + Applications
CountryUnited States
CitySan Diego
Period11/08/201915/08/2019
SeriesProceedings of S P I E - International Society for Optical Engineering
ISSN0277-786X

Cite this