### Abstract

Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

Original language | English |
---|---|

IPC | G01N 23/ 2055 A I |

Patent number | US10139357 |

Filing date | 04/08/2016 |

Country | United States |

Priority date | 07/08/2015 |

Priority number | EP20150180196 |

Publication status | Published - 14 Mar 2019 |

### Bibliographical note

Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1)### Cite this

*US10139357*).

}

*X-ray multigrain crystallography*, Patent No. US10139357, IPC No. G01N 23/ 2055 A I.

**X-ray multigrain crystallography.** / Wejdemann, Christian (Inventor); Poulsen, Henning F (Inventor); Lauridsen, Erik M (Inventor).

Research output: Patent

TY - PAT

T1 - X-ray multigrain crystallography

AU - Wejdemann, Christian

AU - Poulsen, Henning F

AU - Lauridsen, Erik M

N1 - Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1)

PY - 2019/3/14

Y1 - 2019/3/14

N2 - Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

AB - Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

M3 - Patent

M1 - US10139357

Y2 - 2016/08/04

ER -