X-ray multigrain crystallography

Christian Wejdemann (Inventor), Henning F Poulsen (Inventor), Erik M Lauridsen (Inventor)

Research output: Patent

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Abstract

Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

Original languageEnglish
IPCG01N 23/ 2055 A I
Patent numberUS10139357
Filing date04/08/2016
CountryUnited States
Priority date07/08/2015
Priority numberEP20150180196
Publication statusPublished - 14 Mar 2019

Bibliographical note

Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1)

Cite this

Wejdemann, C., Poulsen, H. F., & Lauridsen, E. M. (2019). IPC No. G01N 23/ 2055 A I. X-ray multigrain crystallography. (Patent No. US10139357).