X-ray multigrain crystallography

Christian Wejdemann (Inventor), Henning F Poulsen (Inventor), Erik M Lauridsen (Inventor)

Research output: Patent

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Abstract

Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

Original languageEnglish
IPCG01N 23/ 2055 A I
Patent numberUS10139357
Filing date04/08/2016
CountryUnited States
Priority date07/08/2015
Priority numberEP20150180196
Publication statusPublished - 14 Mar 2019

Bibliographical note

Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1)

Cite this

Wejdemann, C., Poulsen, H. F., & Lauridsen, E. M. (2019). IPC No. G01N 23/ 2055 A I. X-ray multigrain crystallography. (Patent No. US10139357).
Wejdemann, Christian (Inventor) ; Poulsen, Henning F (Inventor) ; Lauridsen, Erik M (Inventor). / X-ray multigrain crystallography. IPC No.: G01N 23/ 2055 A I. Patent No.: US10139357. Aug 04, 2016.
@misc{d57858645a9e4086afeed53c480b5c1d,
title = "X-ray multigrain crystallography",
abstract = "Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.",
author = "Christian Wejdemann and Poulsen, {Henning F} and Lauridsen, {Erik M}",
note = "Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1) ; US10139357; G01N 23/ 2055 A I",
year = "2019",
month = "3",
day = "14",
language = "English",
type = "Patent",

}

Wejdemann, C, Poulsen, HF & Lauridsen, EM Aug. 04 2016, X-ray multigrain crystallography, Patent No. US10139357, IPC No. G01N 23/ 2055 A I.

X-ray multigrain crystallography. / Wejdemann, Christian (Inventor); Poulsen, Henning F (Inventor); Lauridsen, Erik M (Inventor).

IPC No.: G01N 23/ 2055 A I. Patent No.: US10139357. Aug 04, 2016.

Research output: Patent

TY - PAT

T1 - X-ray multigrain crystallography

AU - Wejdemann, Christian

AU - Poulsen, Henning F

AU - Lauridsen, Erik M

N1 - Also published as: CN106442582 (A) EP3128317 (A1) US10288570 (B2) US2017038317 (A1) US2019079032 (A1)

PY - 2019/3/14

Y1 - 2019/3/14

N2 - Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

AB - Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

M3 - Patent

M1 - US10139357

Y2 - 2016/08/04

ER -

Wejdemann C, Poulsen HF, Lauridsen EM, inventors. X-ray multigrain crystallography. G01N 23/ 2055 A I. 2019 Mar 14.