X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions

Jørgen Bilde-Sørensen, C.C. Appel

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationExtended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy
    EditorsE.-L. Punnonen, E. Heikinheimo
    Place of PublicationEspoo
    PublisherSCANDEM-98
    Publication date1998
    Pages7-8
    ISBN (Print)951-22-4023-8
    Publication statusPublished - 1998
    EventSCANDEM 98 - Espoo, Finland
    Duration: 7 Jun 199810 Jun 1998

    Conference

    ConferenceSCANDEM 98
    CountryFinland
    CityEspoo
    Period07/06/199810/06/1998

    Cite this

    Bilde-Sørensen, J., & Appel, C. C. (1998). X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions. In E-L. Punnonen, & E. Heikinheimo (Eds.), Extended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy (pp. 7-8). SCANDEM-98.