X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions

Jørgen Bilde-Sørensen, C.C. Appel

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Extended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy
Editors	E.-L. Punnonen, E. Heikinheimo
Place of Publication	Espoo
Publisher	SCANDEM-98
Publication date	1998
Pages	7-8
ISBN (Print)	951-22-4023-8
Publication status	Published - 1998
Event	SCANDEM 98 - Espoo, Finland Duration: 7 Jun 1998 → 10 Jun 1998

OpenUrl availability

@inbook{22d42659f25b4467bbef578b2eecfce0,

title = "X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions",

keywords = "Industrielle materialer",

author = "J{\o}rgen Bilde-S{\o}rensen and C.C. Appel",

year = "1998",

language = "English",

isbn = "951-22-4023-8",

pages = "7--8",

editor = "E.-L. Punnonen and E. Heikinheimo",

booktitle = "Extended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy",

publisher = "SCANDEM-98",

note = "SCANDEM 98, SCANDEM 98 ; Conference date: 07-06-1998 Through 10-06-1998",

}

X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions. / Bilde-Sørensen, Jørgen; Appel, C.C.
Extended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy. ed. / E.-L. Punnonen; E. Heikinheimo. Espoo: SCANDEM-98, 1998. p. 7-8.

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

TY - ABST

T1 - X-ray microanalysis in low vacuum and environmental SEM: Problems and solutions

AU - Bilde-Sørensen, Jørgen

AU - Appel, C.C.

PY - 1998

Y1 - 1998

KW - Industrielle materialer

M3 - Conference abstract in proceedings

SN - 951-22-4023-8

SP - 7

EP - 8

BT - Extended abstracts of the 50th annual meeting of the Scandinavian Society for Electron Microscopy

A2 - Punnonen, E.-L.

A2 - Heikinheimo, E.

PB - SCANDEM-98

CY - Espoo

T2 - SCANDEM 98

Y2 - 7 June 1998 through 10 June 1998

ER -