X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

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Abstract

We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume1160
Pages (from-to)507-516
ISSN0277-786X
DOIs
Publication statusPublished - 1989
Event33rd Annual Technical Symposium: X-Ray/EUV Optics for Astronomy and Microscopy - San Diego, United States
Duration: 7 Aug 198911 Aug 1989
Conference number: 33

Conference

Conference33rd Annual Technical Symposium
Number33
CountryUnited States
CitySan Diego
Period07/08/198911/08/1989

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