X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

Allan Hornstrup; Finn Erland Christensen; H. W. Schnopper

doi:10.1117/12.962675

X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

Allan Hornstrup, Finn Erland Christensen, H. W. Schnopper

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

Original language	English
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1160
Pages (from-to)	507-516
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.962675
Publication status	Published - 1989
Event	33rd Annual Technical Symposium: X-Ray/EUV Optics for Astronomy and Microscopy - San Diego, United States Duration: 7 Aug 1989 → 11 Aug 1989 Conference number: 33

Conference

Conference	33rd Annual Technical Symposium
Number	33
Country/Territory	United States
City	San Diego
Period	07/08/1989 → 11/08/1989

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@inproceedings{25986bc19dde4d6eae216995d6af3bb1,

title = "X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.",

abstract = "We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.",

author = "Allan Hornstrup and Christensen, {Finn Erland} and Schnopper, {H. W.}",

year = "1989",

doi = "10.1117/12.962675",

language = "English",

volume = "1160",

pages = "507--516",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "Society of Photo-Optical Instrumentation Engineers",

note = "33rd Annual Technical Symposium : X-Ray/EUV Optics for Astronomy and Microscopy ; Conference date: 07-08-1989 Through 11-08-1989",

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TY - GEN

T1 - X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

AU - Hornstrup, Allan

AU - Christensen, Finn Erland

AU - Schnopper, H. W.

N1 - Conference code: 33

PY - 1989

Y1 - 1989

N2 - We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

AB - We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

U2 - 10.1117/12.962675

DO - 10.1117/12.962675

M3 - Conference article

SN - 0277-786X

VL - 1160

SP - 507

EP - 516

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 33rd Annual Technical Symposium

Y2 - 7 August 1989 through 11 August 1989

ER -

X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

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