We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.
|Journal||Proceedings of SPIE, the International Society for Optical Engineering|
|Publication status||Published - 1989|
|Event||33rd Annual Technical Symposium: X-Ray/EUV Optics for Astronomy and Microscopy - San Diego, United States|
Duration: 7 Aug 1989 → 11 Aug 1989
Conference number: 33
|Conference||33rd Annual Technical Symposium|
|Period||07/08/1989 → 11/08/1989|