X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume1160
Pages (from-to)507-516
ISSN0277-786X
DOIs
Publication statusPublished - 1989
Event33rd Annual Technical Symposium: X-Ray/EUV Optics for Astronomy and Microscopy - San Diego, United States
Duration: 7 Aug 198911 Aug 1989
Conference number: 33

Conference

Conference33rd Annual Technical Symposium
Number33
CountryUnited States
CitySan Diego
Period07/08/198911/08/1989

Cite this

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title = "X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.",
abstract = "We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.",
author = "Allan Hornstrup and Christensen, {Finn Erland} and Schnopper, {H. W.}",
year = "1989",
doi = "10.1117/12.962675",
language = "English",
volume = "1160",
pages = "507--516",
journal = "Proceedings of SPIE, the International Society for Optical Engineering",
issn = "0277-786X",
publisher = "S P I E - International Society for Optical Engineering",

}

X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils. / Hornstrup, Allan; Christensen, Finn Erland; Schnopper, H. W.

In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 1160, 1989, p. 507-516.

Research output: Contribution to journalConference articleResearchpeer-review

TY - GEN

T1 - X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

AU - Hornstrup, Allan

AU - Christensen, Finn Erland

AU - Schnopper, H. W.

PY - 1989

Y1 - 1989

N2 - We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

AB - We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

U2 - 10.1117/12.962675

DO - 10.1117/12.962675

M3 - Conference article

VL - 1160

SP - 507

EP - 516

JO - Proceedings of SPIE, the International Society for Optical Engineering

JF - Proceedings of SPIE, the International Society for Optical Engineering

SN - 0277-786X

ER -