X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

E. Findeisen, L. Brügemann, J. Stettner, M. Tolan

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The intensity of Bragg reflections depends strongly on the angle of incidence, if a highly collimated beam of X-rays is impinging at grazing incidence on a thin (200-600 AA) polycrystalline antimony layer. In the case of asymmetric grazing incidence diffraction (AGID) the angle of incidence is small, as the exit angle must be large and nearly twice the Bragg angle. The experimental data are analysed on the basis of the distorted wave Born approximation (DWBA), which yields the thickness d and the optical constants delta and beta of the layer. These parameters are compared with those determined from total external reflection data.
    Original languageEnglish
    JournalJournal of Physics Condensed Matter
    Volume5
    Issue number44
    Pages (from-to)8149-8158
    ISSN0953-8984
    DOIs
    Publication statusPublished - 1993

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