X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

E. Findeisen, L. Brügemann, J. Stettner, M. Tolan

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Journal of Physics Condensed Matter
Volume	5
Pages (from-to)	8149-8158
ISSN	0953-8984
Publication status	Published - 1993

OpenUrl availability

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title = "X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates",

keywords = "Materialer med s{\ae}rlige fysiske og kemiske egenskaber",

author = "E. Findeisen and L. Br{\"u}gemann and J. Stettner and M. Tolan",

year = "1993",

language = "English",

volume = "5",

pages = "8149--8158",

journal = "Journal of Physics Condensed Matter",

issn = "0953-8984",

publisher = "IOP Publishing",

}

TY - JOUR

T1 - X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

AU - Findeisen, E.

AU - Brügemann, L.

AU - Stettner, J.

AU - Tolan, M.

PY - 1993

Y1 - 1993

KW - Materialer med særlige fysiske og kemiske egenskaber

M3 - Journal article

SN - 0953-8984

VL - 5

SP - 8149

EP - 8158

JO - Journal of Physics Condensed Matter

JF - Journal of Physics Condensed Matter

ER -