X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

E. Findeisen, L. Brügemann, J. Stettner, M. Tolan

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Physics: Condensed Matter
    Volume5
    Pages (from-to)8149-8158
    ISSN0953-8984
    Publication statusPublished - 1993

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