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X-ray free-electron laser based dark-field X-ray microscopy: A simulation-based study
Theodor Secanell Holstad*, Trygve Magnus Ræder, Mads Carlsen, Erik Bergbäck Knudsen, Leora Dresselhaus-Marais, Kristoffer Haldrup, Hugh Simons, Martin Meedom Nielsen, Henning Friis Poulsen
*Corresponding author for this work
Research output: Contribution to journal › Journal article › Research › peer-review