X-ray Fourier ptychographic microscopy

Hugh Simons, Henning Friis Poulsen, J. P. Guigay, C. Detlefs*

*Corresponding author for this work

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Abstract

Following the recent developement of Fourier ptychographic microscopy (FPM)in the visible range by Zheng et al. (2013), we propose an adaptation for hardx-rays. FPM employs ptychographic reconstruction to merge a series oflow-resolution, wide field of view images into a high-resolution image. In thex-ray range this opens the possibility to overcome the limited numericalaperture of existing x-ray lenses. Furthermore, digital wave front correction(DWC) may be used to charaterize and correct lens imperfections. Given thediffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10nm range.
Original languageEnglish
JournalarXiv
Number of pages9
Publication statusSubmitted - 2020

Cite this

Simons, H., Poulsen, H. F., Guigay, J. P., & Detlefs, C. (2020). X-ray Fourier ptychographic microscopy. Manuscript submitted for publication.