Following the recent developement of Fourier ptychographic microscopy (FPM)in the visible range by Zheng et al. (2013), we propose an adaptation for hardx-rays. FPM employs ptychographic reconstruction to merge a series oflow-resolution, wide field of view images into a high-resolution image. In thex-ray range this opens the possibility to overcome the limited numericalaperture of existing x-ray lenses. Furthermore, digital wave front correction(DWC) may be used to charaterize and correct lens imperfections. Given thediffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10nm range.
|Number of pages||9|
|Publication status||Submitted - 2020|