X-ray energy dispersive diffraction is used mainly for structural characterization of polycrystalline powders and amorphous materials. One of the important features of it is the fixed scattering angle facilitating in particular studies of materials in special environments (e.g., high pressure, high and low temperature). There are two versions of x-ray energy dispersive diffraction. In one - called XED - an incident "white" beam is used and the spectral distribution of the diffracted photons is analyzed by means of a solid state detector. Its important feature is the simultaneous appearance of all reflections. In the other version - called monochromator scan method (MSM) - the incident beam is monochromatic and its wavelength is changed stepwise by rotating the crystal monochromator. The lecture notes describe both versions and present examples of their applications.
|Place of Publication||Roskilde|
|Publisher||Risø National Laboratory|
|Number of pages||37|
|Publication status||Published - 1988|