X-ray diffraction investigation of the sulphur induced 4x1 reconstruction of Ni(110)

M. Foss, R. Feidenhans'l, M. Nielsen, E. Findeisen, T. Buslaps, R.L. Johnson, F. Besenbacher, I. Stensgaard

    Research output: Contribution to journalJournal articleResearch

    Abstract

    The atomic structure of the Ni(110)4 x 1-S reconstruction has been determined on the basis of surface X-ray diffraction measurements. An analysis of the in-plane diffraction data shows that the model consists of Ni rows along the [001] direction, two for every 4 x 1 unit cell, corresponding to 0.5 ML Ni coverage. The S is chemisorbed in pseudo two-fold hollow sites both on the Ni rows and in the troughs between the rows with a S coverage of 0.75 ML. Furthermore, rod-scans along fractional-order reflections reveal sub-surface relaxations. The results are in good agreement with recent STM and previous AES and radioactive tracer studies.
    Original languageEnglish
    JournalSurface Science
    Volume296
    Pages (from-to)283-290
    ISSN0039-6028
    DOIs
    Publication statusPublished - 1993

    Cite this

    Foss, M., Feidenhans'l, R., Nielsen, M., Findeisen, E., Buslaps, T., Johnson, R. L., Besenbacher, F., & Stensgaard, I. (1993). X-ray diffraction investigation of the sulphur induced 4x1 reconstruction of Ni(110). Surface Science, 296, 283-290. https://doi.org/10.1016/0039-6028(93)90024-E