X-ray diffraction contrast tomography (DCT) system, and an X-ray diffraction contrast tomography (DCT) method

Henning Friis Poulsen (Inventor), Erik Mejdal Lauridsen (Inventor)

Research output: Patent


Source: US2012008736A An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (2), a staging device (5) rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector (6) detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector (7) positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device (15) for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.
Original languageEnglish
Patent numberWO2012003839
Filing date12/01/2012
Publication statusPublished - 2012

Bibliographical note

DTU reference nummer: 92676-11

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