X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. 1. Direct beam case

W. Ludwig, Søren Schmidt, Erik Lauridsen Mejdal, Henning Friis Poulsen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Applied Crystallography
    Volume41
    Pages (from-to)302-309
    ISSN0021-8898
    DOIs
    Publication statusPublished - 2008

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