X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

Anders Filsøe Pedersen, Virginie Chamard, Carsten Detlefs, Tao Zhou, Dina Carbone, Henning Friis Poulsen*

*Corresponding author for this work

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Abstract

We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a grain and avoid overlap of diffraction spots. Iterative oversampling routines are used to reconstruct the shape and strain field within the grain from the far field intensity pattern. The limitation on resolution caused by the finite numerical aperture of the objective is overcome by the Fourier synthesis of several diffraction patterns. We demonstrate the method by an experimental study of a ~500 nm Pt grain for the two cases of a real and a virtual image plane. In the latter case the spatial resolution is 13 nm rms. Our results confirm that no information on the pupil function of the lens is required and that lens aberrations are not critical.
Original languageEnglish
JournalPhysical Review Letters
Number of pages12
ISSN0031-9007
Publication statusSubmitted - 2020

Cite this

Pedersen, A. F., Chamard, V., Detlefs, C., Zhou, T., Carbone, D., & Poulsen, H. F. (2020). X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals. Manuscript submitted for publication.