X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals

A.F. Pedersen, V. Chamard, C. Detlefs, T. Zhou, D. Carbone, H.F. Poulsen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

We demonstrate an x-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a ∼500-nm Pt grain embedded in a polycrystalline Pt matrix is mapped in three dimensions without compromising the spatial resolution. No information on the pupil function of the lens is required and lens aberrations are not critical.
Original languageEnglish
Article number033031
JournalPhysical Review Research
Volume2
Issue number3
Number of pages13
ISSN2643-1564
DOIs
Publication statusPublished - 2020

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