X-ray characterization of a SrTiO3 bicrystal interface

A. Kazimirov, J. Zegenhagen, I. Denk, J. Maier, D.-M. Smilgies, R. Feidenhans'l

    Research output: Contribution to journalJournal articleResearch


    We studied a SrTiO3 bicrystal with X-ray diffraction. It was prepared by fusing two iron doped crystals, with 18.4 degrees miscut from the (001) direction along the [100] azimuth, at elevated pressure and temperature. This miscut corresponds to a (103) orientation of the interface and surface. One of the crystals has been polished to a thickness of 10 mu m to make the interface accessible to the synchrotron X-ray beams. Crystal truncation rod scattering was used to study the structure of the interface. Our results show a very narrow interface region with a thickness of about 11 Angstrom and a significantly changed atomic structure.
    Original languageEnglish
    JournalSurface Science
    Pages (from-to)875-878
    Publication statusPublished - 1996


    Dive into the research topics of 'X-ray characterization of a SrTiO3 bicrystal interface'. Together they form a unique fingerprint.

    Cite this