@inproceedings{785279bfac1e4b32b21bcdce47d078c9,
title = "W/SiC X-ray multilayers optimized for use above 100 keV",
abstract = "We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range Esimilar to150 - 170 keV. We have modeled the hard X-ray reflectance using newly-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied previously, and discuss the significance of these results with regard to the eventual development of a hard X-ray nuclear line telescope. ",
author = "D.L. Windt and S. Dongey and C.J. Hailey and J. Koglin and V. Honkimaki and E. Ziegler and Christensen, \{Finn Erland\} and H.C. Chen and F.A. Harrison and W.W. Craig",
year = "2002",
doi = "10.1117/12.461303",
language = "English",
isbn = " 0-8194-4630-0",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "639--646",
booktitle = "SPIE proceedings",
note = "SPIE Astronomical Telescopes and Instrumentation 2002 ; Conference date: 22-08-2002 Through 28-08-2002",
}