WRF idealized-roughness response: PBL scheme and resolution dependence

Mark C. Kelly (Author), Patrick Volker (Author)

Research output: Non-textual formSound/Visual production (digital)Research

65 Downloads (Pure)
Original languageEnglish
Publication date2016
Media of outputPower Point Presentation
Publication statusPublished - 2016
Event16th EMS Annual Meeting & 11th European Conference on Applied Climatology - Trieste, Italy
Duration: 12 Sep 201616 Sep 2016
http://www.ems2016.eu/

Conference

Conference16th EMS Annual Meeting & 11th European Conference on Applied Climatology
CountryItaly
CityTrieste
Period12/09/201616/09/2016
Internet address

Cite this

Kelly, M. C. (Author), & Volker, P. (Author). (2016). WRF idealized-roughness response: PBL scheme and resolution dependence. Sound/Visual production (digital)
Kelly, Mark C. (Author) ; Volker, Patrick (Author). / WRF idealized-roughness response: PBL scheme and resolution dependence. [Sound/Visual production (digital)].
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year = "2016",
language = "English",

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Kelly, MC & Volker, P, WRF idealized-roughness response: PBL scheme and resolution dependence, 2016, Sound/Visual production (digital).
WRF idealized-roughness response: PBL scheme and resolution dependence. Kelly, Mark C. (Author); Volker, Patrick (Author). 2016. Event: 16th EMS Annual Meeting & 11th European Conference on Applied Climatology, Trieste, Italy.

Research output: Non-textual formSound/Visual production (digital)Research

TY - ADVS

T1 - WRF idealized-roughness response: PBL scheme and resolution dependence

A2 - Kelly, Mark C.

A2 - Volker, Patrick

PY - 2016

Y1 - 2016

M3 - Sound/Visual production (digital)

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