TY - JOUR
T1 - Windowless microfluidic platform based on capillary burst valves for high intensity x-ray measurements
AU - Vig, Asger Laurberg
AU - Haldrup, Kristoffer
AU - Enevoldsen, Nikolaj Brandt
AU - Thilsted, Anil Haraksingh
AU - Eriksen, Johan
AU - Kristensen, Anders
AU - Feidenhans'l, Robert Krarup
AU - Nielsen, Martin Meedom
N1 - Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
PY - 2009
Y1 - 2009
N2 - We propose and describe a microfluidic system for high intensity x-ray measurements. The required open access to a microfluidic channel is provided by an out-of-plane capillary burst valve (CBV). The functionality of the out-of-plane CBV is characterized with respect to the diameter of the windowless access hole, ranging from 10 to 130 Am. Maximum driving pressures from 22 to 280 mbar corresponding to refresh rates of the exposed sample from 300 Hz to 54 kHz is demonstrated. The microfluidic system is tested at beamline ID09b at the ESRF synchrotron radiation facility in Grenoble, and x-ray scattering measurements are shown to be feasible and to require only very limited amounts of sample, <1 ml/h of measurements without recapturing of sample. With small adjustments of the present chip design, scattering angles up to 30 can be achieved without shadowing effects and integration on-chip mixing and spectroscopy appears straightforward. (C) 2009 American Institute of Physics.
AB - We propose and describe a microfluidic system for high intensity x-ray measurements. The required open access to a microfluidic channel is provided by an out-of-plane capillary burst valve (CBV). The functionality of the out-of-plane CBV is characterized with respect to the diameter of the windowless access hole, ranging from 10 to 130 Am. Maximum driving pressures from 22 to 280 mbar corresponding to refresh rates of the exposed sample from 300 Hz to 54 kHz is demonstrated. The microfluidic system is tested at beamline ID09b at the ESRF synchrotron radiation facility in Grenoble, and x-ray scattering measurements are shown to be feasible and to require only very limited amounts of sample, <1 ml/h of measurements without recapturing of sample. With small adjustments of the present chip design, scattering angles up to 30 can be achieved without shadowing effects and integration on-chip mixing and spectroscopy appears straightforward. (C) 2009 American Institute of Physics.
U2 - 10.1063/1.3262498
DO - 10.1063/1.3262498
M3 - Journal article
C2 - 19947764
SN - 0034-6748
VL - 80
SP - 115114
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 11
ER -