Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

Jingda Wu; Edmund Kelleher; Lukas Chrostowski; David Jones; Jeff F. Young

doi:10.1364/CLEO_AT.2020.AM4K.4

Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

Jingda Wu^*
, Edmund Kelleher
, Lukas Chrostowski
, David Jones
, Jeff F. Young

^*Corresponding author for this work

University of British Columbia

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

Original language	English
Title of host publication	Proceedings of 2020 Conference on Lasers and Electro-Optics : Applications and Technology, CLEO_AT 2020
Publisher	IEEE
Publication date	2020
Article number	AM4K.4
ISBN (Electronic)	9781943580767
DOIs	https://doi.org/10.1364/CLEO_AT.2020.AM4K.4
Publication status	Published - 2020
Event	CLEO: Applications and Technology 2020 - Washington, United States Duration: 10 May 2020 → 15 May 2020 https://opg.optica.org/conference.cfm?meetingid=123&yr=2020

Conference

Conference	CLEO: Applications and Technology 2020
Country/Territory	United States
City	Washington
Period	10/05/2020 → 15/05/2020
Internet address	https://opg.optica.org/conference.cfm?meetingid=123&yr=2020

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@inproceedings{5a5dc27c51fe4bd6b1f1cac69f7f9800,

title = "Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm",

abstract = "A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.",

author = "Jingda Wu and Edmund Kelleher and Lukas Chrostowski and David Jones and Young, \{Jeff F.\}",

year = "2020",

doi = "10.1364/CLEO\_AT.2020.AM4K.4",

language = "English",

booktitle = "Proceedings of 2020 Conference on Lasers and Electro-Optics",

publisher = "IEEE",

address = "United States",

note = "CLEO: Applications and Technology 2020, CLEO AT 2020 ; Conference date: 10-05-2020 Through 15-05-2020",

url = "https://opg.optica.org/conference.cfm?meetingid=123\&yr=2020",

}

Wu, J, Kelleher, E, Chrostowski, L, Jones, D & Young, JF 2020, Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm. in Proceedings of 2020 Conference on Lasers and Electro-Optics: Applications and Technology, CLEO_AT 2020., AM4K.4, IEEE, CLEO: Applications and Technology 2020, Washington, District of Columbia, United States, 10/05/2020. https://doi.org/10.1364/CLEO_AT.2020.AM4K.4

Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm. / Wu, Jingda; Kelleher, Edmund; Chrostowski, Lukas et al.
Proceedings of 2020 Conference on Lasers and Electro-Optics: Applications and Technology, CLEO_AT 2020. IEEE, 2020. AM4K.4.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

AU - Wu, Jingda

AU - Kelleher, Edmund

AU - Chrostowski, Lukas

AU - Jones, David

AU - Young, Jeff F.

PY - 2020

Y1 - 2020

N2 - A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

AB - A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

U2 - 10.1364/CLEO_AT.2020.AM4K.4

DO - 10.1364/CLEO_AT.2020.AM4K.4

M3 - Article in proceedings

AN - SCOPUS:85095113750

BT - Proceedings of 2020 Conference on Lasers and Electro-Optics

PB - IEEE

T2 - CLEO: Applications and Technology 2020

Y2 - 10 May 2020 through 15 May 2020

ER -

Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

Abstract

Conference

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