Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

Jingda Wu; Edmund Kelleher; Lukas Chrostowski; David Jones; Jeff F. Young

Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

Jingda Wu^*
, Edmund Kelleher
, Lukas Chrostowski
, David Jones
, Jeff F. Young

^*Corresponding author for this work

University of British Columbia

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

Original language	English
Title of host publication	2020 Conference on Lasers and Electro-Optics
Number of pages	2
Publisher	IEEE
Publication date	2020
Article number	AM4K.4
ISBN (Print)	9781943580767
Publication status	Published - 2020
Event	2020 Conference on Lasers and Electro-Optics (CLEO) - San Jose McEnery Convention Center, San Jose, United States Duration: 11 May 2020 → 15 May 2020 http://www.cleoconference.org

Conference

Conference	2020 Conference on Lasers and Electro-Optics (CLEO)
Location	San Jose McEnery Convention Center
Country/Territory	United States
City	San Jose
Period	11/05/2020 → 15/05/2020
Internet address	http://www.cleoconference.org

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@inproceedings{087a2723da0e47389c654bf3d702c89f,

title = "Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm",

abstract = "A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.",

author = "Jingda Wu and Edmund Kelleher and Lukas Chrostowski and David Jones and Young, \{Jeff F.\}",

year = "2020",

language = "English",

isbn = "9781943580767",

booktitle = "2020 Conference on Lasers and Electro-Optics",

publisher = "IEEE",

address = "United States",

note = "2020 Conference on Lasers and Electro-Optics (CLEO), CLEO 2020 ; Conference date: 11-05-2020 Through 15-05-2020",

url = "http://www.cleoconference.org",

}

TY - GEN

T1 - Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

AU - Wu, Jingda

AU - Kelleher, Edmund

AU - Chrostowski, Lukas

AU - Jones, David

AU - Young, Jeff F.

PY - 2020

Y1 - 2020

N2 - A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

AB - A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

M3 - Article in proceedings

SN - 9781943580767

BT - 2020 Conference on Lasers and Electro-Optics

PB - IEEE

T2 - 2020 Conference on Lasers and Electro-Optics (CLEO)

Y2 - 11 May 2020 through 15 May 2020

ER -

Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

Abstract

Conference

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