Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

Jingda Wu*, Edmund Kelleher, Lukas Chrostowski, David Jones, Jeff F. Young

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.
    Original languageEnglish
    Title of host publication2020 Conference on Lasers and Electro-Optics
    Number of pages2
    PublisherIEEE
    Publication date2020
    Article numberAM4K.4
    ISBN (Print)9781943580767
    Publication statusPublished - 2020
    Event2020 Conference on Lasers and Electro-Optics (CLEO) - San Jose McEnery Convention Center, San Jose, United States
    Duration: 11 May 202015 May 2020
    http://www.cleoconference.org

    Conference

    Conference2020 Conference on Lasers and Electro-Optics (CLEO)
    LocationSan Jose McEnery Convention Center
    Country/TerritoryUnited States
    CitySan Jose
    Period11/05/202015/05/2020
    Internet address

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