Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm

Jingda Wu*, Edmund Kelleher, Lukas Chrostowski, David Jones, Jeff F. Young

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.
Original languageEnglish
Title of host publication2020 Conference on Lasers and Electro-Optics
Number of pages2
PublisherIEEE
Publication date2020
Article numberAM4K.4
ISBN (Print)9781943580767
Publication statusPublished - 2020
Event2020 Conference on Lasers and Electro-Optics (CLEO) - San Jose McEnery Convention Center, San Jose, United States
Duration: 11 May 202015 May 2020
http://www.cleoconference.org

Conference

Conference2020 Conference on Lasers and Electro-Optics (CLEO)
LocationSan Jose McEnery Convention Center
CountryUnited States
CitySan Jose
Period11/05/202015/05/2020
Internet address
Series2020 Conference on Lasers and Electro-optics (cleo)
ISSN1092-8081

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