Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

Jingda Wu*, Edmund Kelleher, Lukas Chrostowski, David Jones, Jeff F. Young

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

Original languageEnglish
Title of host publicationProceedings of 2020 Conference on Lasers and Electro-Optics : Applications and Technology, CLEO_AT 2020
PublisherIEEE
Publication date2020
Article numberAM4K.4
ISBN (Electronic)9781943580767
DOIs
Publication statusPublished - 2020
EventCLEO: Applications and Technology - Washington, United States
Duration: 10 May 202015 May 2020

Conference

ConferenceCLEO: Applications and Technology
CountryUnited States
CityWashington
Period10/05/202015/05/2020

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