A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.
|Title of host publication||Proceedings of 2020 Conference on Lasers and Electro-Optics : Applications and Technology, CLEO_AT 2020|
|Publication status||Published - 2020|
|Event||CLEO: Applications and Technology - Washington, United States|
Duration: 10 May 2020 → 15 May 2020
|Conference||CLEO: Applications and Technology|
|Period||10/05/2020 → 15/05/2020|