Widely tunable, fast scanning, narrow linewidth, Mid-IR source centred at 2.9 µm

Jingda Wu*, Edmund Kelleher, Lukas Chrostowski, David Jones, Jeff F. Young

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 µm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.

    Original languageEnglish
    Title of host publicationProceedings of 2020 Conference on Lasers and Electro-Optics : Applications and Technology, CLEO_AT 2020
    PublisherIEEE
    Publication date2020
    Article numberAM4K.4
    ISBN (Electronic)9781943580767
    DOIs
    Publication statusPublished - 2020
    EventCLEO: Applications and Technology 2020 - Washington, United States
    Duration: 10 May 202015 May 2020
    https://opg.optica.org/conference.cfm?meetingid=123&yr=2020

    Conference

    ConferenceCLEO: Applications and Technology 2020
    Country/TerritoryUnited States
    CityWashington
    Period10/05/202015/05/2020
    Internet address

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