Wide Line Surface-Enhanced Raman Scattering Mapping

Oleksii Ilchenko; Roman Slipets; Tomas Rindzevicius; Onur Durucan; Lidia Morelli; Michael Stenbæk Schmidt; Kaiyu Wu; Anja Boisen

doi:10.1002/admt.201900999

Wide Line Surface-Enhanced Raman Scattering Mapping

Oleksii Ilchenko^*
, Roman Slipets
, Tomas Rindzevicius
, Onur Durucan
, Lidia Morelli
, Michael Stenbæk Schmidt
, Kaiyu Wu
, Anja Boisen

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic “hot spots” in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.

Original language	English
Article number	1900999
Journal	Advanced Materials
Volume	5
Issue number	6
Number of pages	8
ISSN	0935-9648
DOIs	https://doi.org/10.1002/admt.201900999
Publication status	Published - 2020

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title = "Wide Line Surface-Enhanced Raman Scattering Mapping",

abstract = "Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic {\textquotedblleft}hot spots{\textquotedblright} in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.",

author = "Oleksii Ilchenko and Roman Slipets and Tomas Rindzevicius and Onur Durucan and Lidia Morelli and Schmidt, \{Michael Stenb{\ae}k\} and Kaiyu Wu and Anja Boisen",

year = "2020",

doi = "10.1002/admt.201900999",

language = "English",

volume = "5",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "John Wiley and Sons Inc.",

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T1 - Wide Line Surface-Enhanced Raman Scattering Mapping

AU - Ilchenko, Oleksii

AU - Slipets, Roman

AU - Rindzevicius, Tomas

AU - Durucan, Onur

AU - Morelli, Lidia

AU - Schmidt, Michael Stenbæk

AU - Wu, Kaiyu

AU - Boisen, Anja

PY - 2020

Y1 - 2020

N2 - Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic “hot spots” in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.

AB - Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic “hot spots” in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.

U2 - 10.1002/admt.201900999

DO - 10.1002/admt.201900999

M3 - Journal article

SN - 0935-9648

VL - 5

JO - Advanced Materials

JF - Advanced Materials

IS - 6

M1 - 1900999

ER -

Wide Line Surface-Enhanced Raman Scattering Mapping

Abstract

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