Wide Line Surface-Enhanced Raman Scattering Mapping

Oleksii Ilchenko*, Roman Slipets, Tomas Rindzevicius, Onur Durucan, Lidia Morelli, Michael Stenbæk Schmidt, Kaiyu Wu, Anja Boisen

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic “hot spots” in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.
Original languageEnglish
Article number1900999
JournalAdvanced Materials Technologies
Volume5
Issue number6
Number of pages8
ISSN2365-709x
DOIs
Publication statusPublished - 2020

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