Wafer through-hole interconnections for high vertical wiring densities

Carsten Christensen, Siebe Bouwstra, Jon Wulff Petersen

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationEuPac 96
    Place of PublicationEssen, Germany
    Publication date1996
    Pages81-82
    Publication statusPublished - 1996

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