Abstract
The electronic properties of single-layer graphene, such as surface conductance, carrier concentration, scattering time and mobility, can be characterized in a noncontact manner by THz time-domain spectroscopy. Standard spectroscopic imaging reveals the AC conductance over large areas with a few hundred μm resolution, and spectroscopic imaging on back-gated graphene allows for extraction of both the carrier concentration and the mobility. We find that spatial variations of the conductance of single-layer CVD-grown graphene are predominantly due to variations in mobility rather than in carrier concentration.
Original language | English |
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Title of host publication | Proceedings of 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves |
Number of pages | 2 |
Publisher | IEEE |
Publication date | 2015 |
Pages | 1-2 |
ISBN (Print) | 9781479982721 |
DOIs | |
Publication status | Published - 2015 |
Event | 40th International Conference on Infrared, Millimeter, and Terahertz Waves - Chinese University of Hong Kong, Hong Kong Duration: 23 Aug 2015 → 28 Aug 2015 |
Conference
Conference | 40th International Conference on Infrared, Millimeter, and Terahertz Waves |
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Location | Chinese University of Hong Kong |
Country/Territory | Hong Kong |
Period | 23/08/2015 → 28/08/2015 |
Keywords
- Communication, Networking and Broadcast Technologies
- Engineered Materials, Dielectrics and Plasmas
- Fields, Waves and Electromagnetics
- Photonics and Electrooptics
- Films
- Graphene
- Imaging
- Logic gates
- Scattering
- Spectroscopy
- Time-domain analysis