Wafer-scale characterization of carrier dynamics in graphene

Jonas Christian Due Buron, Dirch Hjorth Petersen, Peter Bøggild, Peter Uhd Jepsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    The electronic properties of single-layer graphene, such as surface conductance, carrier concentration, scattering time and mobility, can be characterized in a noncontact manner by THz time-domain spectroscopy. Standard spectroscopic imaging reveals the AC conductance over large areas with a few hundred μm resolution, and spectroscopic imaging on back-gated graphene allows for extraction of both the carrier concentration and the mobility. We find that spatial variations of the conductance of single-layer CVD-grown graphene are predominantly due to variations in mobility rather than in carrier concentration.
    Original languageEnglish
    Title of host publicationProceedings of 2015 40th International Conference on Infrared, Millimeter, and Terahertz waves
    Number of pages2
    PublisherIEEE
    Publication date2015
    Pages1-2
    ISBN (Print)9781479982721
    DOIs
    Publication statusPublished - 2015
    Event40th International Conference on Infrared, Millimeter, and Terahertz Waves - Chinese University of Hong Kong, Hong Kong
    Duration: 23 Aug 201528 Aug 2015

    Conference

    Conference40th International Conference on Infrared, Millimeter, and Terahertz Waves
    LocationChinese University of Hong Kong
    Country/TerritoryHong Kong
    Period23/08/201528/08/2015

    Keywords

    • Communication, Networking and Broadcast Technologies
    • Engineered Materials, Dielectrics and Plasmas
    • Fields, Waves and Electromagnetics
    • Photonics and Electrooptics
    • Films
    • Graphene
    • Imaging
    • Logic gates
    • Scattering
    • Spectroscopy
    • Time-domain analysis

    Fingerprint

    Dive into the research topics of 'Wafer-scale characterization of carrier dynamics in graphene'. Together they form a unique fingerprint.

    Cite this