Volume management for fault-tolerant continuous-flow microfluidics

Alexander Rüdiger Schneider, Paul Pop, Jan Madsen

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Abstract

Recent advancements in microfluidic biochips allow for easier and faster design and fabrication of increasingly complex biochips to replace conventional laboratories. A roadblock in the deployment of biochips however is their low reliability. Physical defects can be introduced during the fabrication process, and may lead to failure of the biochemical application. This can be costly because of the reduced manufacturing yield, the need to redo lengthy experiments, using expensive reagents, and can be safety-critical, e.g., in case of a cancer misdiagnosis. Researchers have started to propose fault models and test techniques for continuous flow biochips. Six typical defects: Block, leak, misalignment, faulty pumps, degradation of valves and dimensional errors have been identified. The resulting faults can be abstracted into blocks and leaks for simplicity. Both fault types can occur in the control-as well as the flow channel, some common causes being environmental particles, imperfections in molds or bubbles in the PDMS gel. While some faults may be detected before the execution of an application by introducing a test run, other faults occur only during runtime as a result of deterioration or caused by the applied pressure. If such a fault is detected during runtime, e.g. with a CCD camera, we propose a just in time solution that calculates and assigns fluid volumes to alternate components and routes allowing for the completion of the application despite the occurring fault.
Original languageEnglish
Title of host publicationProceedings of 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Number of pages1
Volume2017
PublisherIEEE
Publication date2017
Pages102-102
ISBN (Print)9781538603628
DOIs
Publication statusPublished - 2017
Event2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge, United Kingdom
Duration: 23 Oct 201725 Oct 2017
Conference number: 30th

Conference

Conference2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Number30th
CountryUnited Kingdom
CityCambridge
Period23/10/201725/10/2017

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