Visualizing In-Plane Junctions in Nitrogen-Doped Graphene

Mehdi Bouatou, Cyril Chacon, Aleksander Bach Lorentzen, Huu Thoai Ngo, Yann Girard, Vincent Repain, Amandine Bellec, Sylvie Rousset, Mads Brandbyge, Yannick J. Dappe, Jérôme Lagoute*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Controlling the spatial distribution of dopants in graphene is the gateway to the realization of graphene-based electronic components. Here, it is shown that a submonolayer of self-assembled physisorbed molecules can be used as a resist during a post-synthesis nitrogen doping process to realize a nanopatterning of nitrogen dopants in graphene. The resulting formation of domains with different nitrogen concentrations allows obtaining n–n’ and p–n junctions in graphene. A scanning tunneling microscopy is used to measure the electronic properties of the junctions at the atomic scale and reveal their intrinsic width that is found to be ≈7 nm corresponding to a sharp junction regime.

Original languageEnglish
Article number2208048
JournalAdvanced Functional Materials
Volume32
Issue number47
Number of pages8
ISSN1616-301X
DOIs
Publication statusPublished - 2022

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