Visualization of low-misorientation dislocation structures from orientation data using customized All-Euler maps

Chuanshi Hong*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

A method for visualization of low-misorientation dislocation structures from orientation data obtained by electron backscatter diffraction (EBSD) in scanning electron microscopy is presented. The method is termed “customized All-Euler maps”. The microstructure of high purity (99.996 wt.%) aluminum lightly rolled to a thickness reduction of 12% is presented as a case study. Dislocation structures with misorientations across dislocation boundaries approaching the orientation precision of standard EBSD (∼0.5°) are revealed using the customized All-Euler maps. Cautions and limitations in using such maps are discussed.
Original languageEnglish
Article number012033
JournalI O P Conference Series: Materials Science and Engineering
Volume580
Issue number1
Number of pages6
ISSN1757-8981
DOIs
Publication statusPublished - 2019
Event40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D - Roskilde, Denmark
Duration: 2 Sep 20196 Sep 2019

Conference

Conference40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D
CountryDenmark
CityRoskilde
Period02/09/201906/09/2019

Bibliographical note

GA no. 788567

Projects

M4D: Metal Microstructures in Four Dimensions

Juul Jensen, D.

01/10/201830/09/2023

Project: Research

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