Visualization of low-misorientation dislocation structures from orientation data using customized All-Euler maps

Chuanshi Hong*

*Corresponding author for this work

    Research output: Contribution to journalJournal articleResearchpeer-review

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    Abstract

    A method for visualization of low-misorientation dislocation structures from orientation data obtained by electron backscatter diffraction (EBSD) in scanning electron microscopy is presented. The method is termed “customized All-Euler maps”. The microstructure of high purity (99.996 wt.%) aluminum lightly rolled to a thickness reduction of 12% is presented as a case study. Dislocation structures with misorientations across dislocation boundaries approaching the orientation precision of standard EBSD (∼0.5°) are revealed using the customized All-Euler maps. Cautions and limitations in using such maps are discussed.
    Original languageEnglish
    Article number012033
    JournalI O P Conference Series: Materials Science and Engineering
    Volume580
    Issue number1
    Number of pages6
    ISSN1757-8981
    DOIs
    Publication statusPublished - 2019
    Event40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D - Roskilde, Denmark
    Duration: 2 Sept 20196 Sept 2019

    Conference

    Conference40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D
    Country/TerritoryDenmark
    CityRoskilde
    Period02/09/201906/09/2019

    Bibliographical note

    GA no. 788567

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