Visualization of Isofrequency Contours of Strongly Localized Waveguide Modes in Planar Dielectric Structures

D. V. Permyakov*, I. S. Sinev, S. K. Sychev, A. S. Gudovskikh, A. A. Bogdanov, A. V. Lavrinenko, A. K. Samusev

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

An experimental method has been proposed to study the dispersion properties of optical surface and waveguide modes in planar structures. An experimental setup involves a microscope with a high numerical aperture objective and a hemispherical solid immersion lens made of zinc selenide in contact with the sample surface. The reflection from the sample is detected in the back focal plane of the system. Such a configuration makes it possible to study strongly localized states with an effective refractive index up to 2.25 in the visible and near infrared spectral ranges. For a thin silicon layer deposited on a glass substrate, the possibility of visualization of isofrequency contrours with polarization resolution and the reconstruction of dispersion of waveguide modes depending on the direction of their propagation has been demonstrated.
Original languageEnglish
JournalJ E T P Letters
Volume107
Issue number1
Pages (from-to)10-14
Number of pages5
ISSN0021-3640
DOIs
Publication statusPublished - 2018

Bibliographical note

Original Russian Text © D.V. Permyakov, I.S. Sinev, S.K. Sychev, A.S. Gudovskikh, A.A. Bogdanov, A.V. Lavrinenko, A.K. Samusev, 2018, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2018, Vol. 107, No. 1, pp. 12–17.

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Cite this

Permyakov, D. V., Sinev, I. S., Sychev, S. K., Gudovskikh, A. S., Bogdanov, A. A., Lavrinenko, A. V., & Samusev, A. K. (2018). Visualization of Isofrequency Contours of Strongly Localized Waveguide Modes in Planar Dielectric Structures. J E T P Letters, 107(1), 10-14. https://doi.org/10.1134/S0021364018010083