Abstract
An experimental method has been proposed to study the dispersion properties of optical surface and waveguide modes in planar structures. An experimental setup involves a microscope with a high numerical aperture objective and a hemispherical solid immersion lens made of zinc selenide in contact with the sample surface. The reflection from the sample is detected in the back focal plane of the system. Such a configuration makes it possible to study strongly localized states with an effective refractive index up to 2.25 in the visible and near infrared spectral ranges. For a thin silicon layer deposited on a glass substrate, the possibility of visualization of isofrequency contrours with polarization resolution and the reconstruction of dispersion of waveguide modes depending on the direction of their propagation has been demonstrated.
| Original language | English |
|---|---|
| Journal | J E T P Letters |
| Volume | 107 |
| Issue number | 1 |
| Pages (from-to) | 10-14 |
| Number of pages | 5 |
| ISSN | 0021-3640 |
| DOIs | |
| Publication status | Published - 2018 |
Bibliographical note
Original Russian Text © D.V. Permyakov, I.S. Sinev, S.K. Sychev, A.S. Gudovskikh, A.A. Bogdanov, A.V. Lavrinenko, A.K. Samusev, 2018, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2018, Vol. 107, No. 1, pp. 12–17.Keywords
- ,