Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

E.S. Dreier*, C. Silvestre, J. Kehres, D. Turecek, M. Khalil, J.H. Hemmingsen, O. Hansen, J. Jakubek, R. Feidenhans'l, U.L. Olsen

*Corresponding author for this work

Research output: Contribution to journalConference articleResearchpeer-review

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Abstract

X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup’s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution.
Original languageEnglish
Article numberC01011
JournalJournal of Instrumentation
Volume14
Issue number01
Number of pages9
ISSN1748-0221
DOIs
Publication statusPublished - 2019
Event20th International Workshop on Radiation Imaging Detectors - Sundsvall, Sweden
Duration: 24 Jun 201828 Jun 2018
Conference number: 20

Conference

Conference20th International Workshop on Radiation Imaging Detectors
Number20
CountrySweden
CitySundsvall
Period24/06/201828/06/2018

Cite this

@inproceedings{d983b26ff5754dbe93addc4ec4941a36,
title = "Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3",
abstract = "X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup’s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution.",
author = "E.S. Dreier and C. Silvestre and J. Kehres and D. Turecek and M. Khalil and J.H. Hemmingsen and O. Hansen and J. Jakubek and R. Feidenhans'l and U.L. Olsen",
year = "2019",
doi = "10.1088/1748-0221/14/01/C01011",
language = "English",
volume = "14",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "IOP Publishing",
number = "01",

}

Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3. / Dreier, E.S.; Silvestre, C.; Kehres, J.; Turecek, D.; Khalil, M.; Hemmingsen, J.H.; Hansen, O.; Jakubek, J.; Feidenhans'l, R.; Olsen, U.L.

In: Journal of Instrumentation, Vol. 14, No. 01, C01011, 2019.

Research output: Contribution to journalConference articleResearchpeer-review

TY - GEN

T1 - Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

AU - Dreier, E.S.

AU - Silvestre, C.

AU - Kehres, J.

AU - Turecek, D.

AU - Khalil, M.

AU - Hemmingsen, J.H.

AU - Hansen, O.

AU - Jakubek, J.

AU - Feidenhans'l, R.

AU - Olsen, U.L.

PY - 2019

Y1 - 2019

N2 - X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup’s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution.

AB - X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup’s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution.

U2 - 10.1088/1748-0221/14/01/C01011

DO - 10.1088/1748-0221/14/01/C01011

M3 - Conference article

VL - 14

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

IS - 01

M1 - C01011

ER -