Very High Frequency Two-Port Characterization of Transistors

Research output: Contribution to conferencePoster – Annual report year: 2016Research

Standard

Very High Frequency Two-Port Characterization of Transistors. / Hertel, Jens Christian; Nour, Yasser; Jørgensen, Ivan Harald Holger; Knott, Arnold.

2016. Poster session presented at 5th International Workshop on Power Supply On Chip, Madrid, Spain.

Research output: Contribution to conferencePoster – Annual report year: 2016Research

Harvard

Hertel, JC, Nour, Y, Jørgensen, IHH & Knott, A 2016, 'Very High Frequency Two-Port Characterization of Transistors' 5th International Workshop on Power Supply On Chip, Madrid, Spain, 03/10/2016 - 05/10/2016, .

APA

Hertel, J. C., Nour, Y., Jørgensen, I. H. H., & Knott, A. (2016). Very High Frequency Two-Port Characterization of Transistors. Poster session presented at 5th International Workshop on Power Supply On Chip, Madrid, Spain.

CBE

Hertel JC, Nour Y, Jørgensen IHH, Knott A. 2016. Very High Frequency Two-Port Characterization of Transistors. Poster session presented at 5th International Workshop on Power Supply On Chip, Madrid, Spain.

MLA

Vancouver

Hertel JC, Nour Y, Jørgensen IHH, Knott A. Very High Frequency Two-Port Characterization of Transistors. 2016. Poster session presented at 5th International Workshop on Power Supply On Chip, Madrid, Spain.

Author

Hertel, Jens Christian ; Nour, Yasser ; Jørgensen, Ivan Harald Holger ; Knott, Arnold. / Very High Frequency Two-Port Characterization of Transistors. Poster session presented at 5th International Workshop on Power Supply On Chip, Madrid, Spain.3 p.

Bibtex

@conference{d13cf294979242898661a1b299e71ffc,
title = "Very High Frequency Two-Port Characterization of Transistors",
abstract = "To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.",
author = "Hertel, {Jens Christian} and Yasser Nour and J{\o}rgensen, {Ivan Harald Holger} and Arnold Knott",
year = "2016",
language = "English",
note = "5th International Workshop on Power Supply On Chip, PwrSoC 2016 ; Conference date: 03-10-2016 Through 05-10-2016",

}

RIS

TY - CONF

T1 - Very High Frequency Two-Port Characterization of Transistors

AU - Hertel, Jens Christian

AU - Nour, Yasser

AU - Jørgensen, Ivan Harald Holger

AU - Knott, Arnold

PY - 2016

Y1 - 2016

N2 - To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.

AB - To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.

M3 - Poster

ER -