Very High Frequency Two-Port Characterization of Transistors

Research output: Contribution to conferencePosterResearch

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Abstract

To properly use transistors in VHF converters, they need to be characterized under similar conditions. This research presents a two-port method, using a network analyzer (NWA) with a S-port setup. The method is a one-shot method, providing fast results of the off-state parasitics of the transistors.
Original languageEnglish
Publication date2016
Number of pages3
Publication statusPublished - 2016
Event 5th International Workshop on Power Supply On Chip - Centro de ELectronica Industrial, Madrid, Spain
Duration: 3 Oct 20165 Oct 2016
Conference number: 5

Conference

Conference 5th International Workshop on Power Supply On Chip
Number5
LocationCentro de ELectronica Industrial
CountrySpain
CityMadrid
Period03/10/201605/10/2016

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