Variable inner detector angle STEM: Visualising diffraction contrast in semiconductor nanowires

Johan Mikael Persson, Robert S. Pennington, Jakob Birkedal Wagner, Chris Boothroyd, Rafal E. Dunin-Borkowski

    Research output: Contribution to conferencePosterResearchpeer-review

    Original languageEnglish
    Publication date2010
    Publication statusPublished - 2010
    EventSCANDEM 2010 : High-Resolution Microscopy Meeting - Kista Elektrum, Stockholm, Sweden
    Duration: 8 Jun 201010 Jun 2010

    Conference

    ConferenceSCANDEM 2010
    LocationKista Elektrum
    CountrySweden
    CityStockholm
    Period08/06/201010/06/2010

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