Using grating based X-ray contrast modalities for metrology

Jais Andreas Breusch Angel, T. Lauridsen, R. Feidenhans'l, M.S. Nielsen, Leonardo De Chiffre

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    Abstract

    Traditionally, segmentation between multi-materials in CT is only available for cases, where material densities are not close to each other. A novel method called GBI offers a new possibility to overcome this problem, and was evaluated with respect to its metrological performance by comparisons to traceable measurements. The measurement results show that further development related to stability issues on the used CT is needed to create a metrological tool using GBI.
    Original languageEnglish
    Title of host publicationProceedings of the 14th euspen International Conference
    Number of pages4
    Publishereuspen
    Publication date2014
    Pages157-160
    Publication statusPublished - 2014
    Event14th International Conference of the European Society for Precision Engineering and Nanotechnology - Valamar Lacroma Hotel, Dubrovnik, Croatia
    Duration: 2 Jun 20146 Jun 2014
    Conference number: 14

    Conference

    Conference14th International Conference of the European Society for Precision Engineering and Nanotechnology
    Number14
    LocationValamar Lacroma Hotel
    Country/TerritoryCroatia
    CityDubrovnik
    Period02/06/201406/06/2014

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