Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

J. X. Sierra; H. F. Poulsen; P. S. Jørgensen; C. Detlefs; P. Cook; J. R. Bowen

Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

J. X. Sierra, H. F. Poulsen, P. S. Jørgensen, C. Detlefs, P. Cook, J. R. Bowen

The European Synchrotron

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Abstract

Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating conditions.

Original language	English
Publication date	2017
Number of pages	2
Publication status	Published - 2017
Event	3rd International Conference on Tomography of 3D Materials and Structures - Lund, Sweden Duration: 26 Jun 2017 → 30 Jun 2017 http://ictms2017.lth.se/

Conference

Conference	3rd International Conference on Tomography of 3D Materials and Structures
Country/Territory	Sweden
City	Lund
Period	26/06/2017 → 30/06/2017
Internet address	http://ictms2017.lth.se/

Keywords

Yttria Stabilized Zirconia
Dark Field X-ray Microscopy
Local x-ray diffraction
In-operando

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ICTMS2017 34Final published version, 187 KB

http://meetingorganizer.copernicus.org/ICTMS2017/poster_programme/26271

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Sierra, J. X., Poulsen, H. F., Jørgensen, P. S., Detlefs, C., Cook, P., & Bowen, J. R. (2017). Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell. Abstract from 3rd International Conference on Tomography of 3D Materials and Structures, Lund, Sweden. http://meetingorganizer.copernicus.org/ICTMS2017/poster_programme/26271

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title = "Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell",

abstract = "Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating conditions. ",

keywords = " Yttria Stabilized Zirconia, Dark Field X-ray Microscopy, Local x-ray diffraction, In-operando",

author = "Sierra, {J. X.} and Poulsen, {H. F.} and J{\o}rgensen, {P. S.} and C. Detlefs and P. Cook and Bowen, {J. R.}",

year = "2017",

language = "English",

note = "3rd International Conference on Tomography of 3D Materials and Structures, ICTMS 2017 ; Conference date: 26-06-2017 Through 30-06-2017",

url = "http://ictms2017.lth.se/",

}

Sierra, JX, Poulsen, HF , Jørgensen, PS, Detlefs, C, Cook, P & Bowen, JR 2017, 'Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell', 3rd International Conference on Tomography of 3D Materials and Structures, Lund, Sweden, 26/06/2017 - 30/06/2017. <http://meetingorganizer.copernicus.org/ICTMS2017/poster_programme/26271>

Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell. / Sierra, J. X.; Poulsen, H. F.; Jørgensen, P. S. et al.
2017. Abstract from 3rd International Conference on Tomography of 3D Materials and Structures, Lund, Sweden.

Research output: Contribution to conference › Conference abstract for conference › Research

TY - ABST

T1 - Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

AU - Sierra, J. X.

AU - Poulsen, H. F.

AU - Jørgensen, P. S.

AU - Detlefs, C.

AU - Cook, P.

AU - Bowen, J. R.

PY - 2017

Y1 - 2017

N2 - Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating conditions.

AB - Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating conditions.

KW - Yttria Stabilized Zirconia

KW - Dark Field X-ray Microscopy

KW - Local x-ray diffraction

KW - In-operando

M3 - Conference abstract for conference

T2 - 3rd International Conference on Tomography of 3D Materials and Structures

Y2 - 26 June 2017 through 30 June 2017

ER -

Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

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Keywords

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