Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

J. X. Sierra, H. F. Poulsen, P. S. Jørgensen, C. Detlefs, P. Cook, J. R. Bowen

Research output: Contribution to conferenceConference abstract for conferenceResearch

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Abstract

Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating conditions.

Original languageEnglish
Publication date2017
Number of pages2
Publication statusPublished - 2017
Event3rd International Conference on Tomography of 3D Materials and Structures - Lund, Sweden
Duration: 26 Jun 201730 Jun 2017
http://ictms2017.lth.se/

Conference

Conference3rd International Conference on Tomography of 3D Materials and Structures
CountrySweden
CityLund
Period26/06/201730/06/2017
Internet address

Keywords

  • Yttria Stabilized Zirconia
  • Dark Field X-ray Microscopy
  • Local x-ray diffraction
  • In-operando

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