Use of elevated temperature in-situ transmission Kikuchi diffraction for the study of ultra-thin metal films

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Original language	English
Publication date	2018
Number of pages	2
Publication status	Published - 2018
Event	Electron Backscatter Diffraction Topical Conference 2018 - University of Michigan, Ann Arbor, United States Duration: 23 May 2018 → 25 May 2018

Conference	Electron Backscatter Diffraction Topical Conference 2018
Location	University of Michigan
Country/Territory	United States
City	Ann Arbor
Period	23/05/2018 → 25/05/2018

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@conference{666a88ecc9e74551ae15c16719fbb69c,

title = "Use of elevated temperature in-situ transmission Kikuchi diffraction for the study of ultra-thin metal films",

author = "Matteo Todeschini and Henri Jansen and Wagner, {Jakob Birkedal} and {Bastos da Silva Fanta}, Alice",

year = "2018",

language = "English",

note = "Electron Backscatter Diffraction Topical Conference 2018 , EBSD 2018 ; Conference date: 23-05-2018 Through 25-05-2018",

}

Use of elevated temperature in-situ transmission Kikuchi diffraction for the study of ultra-thin metal films. / Todeschini, Matteo; Jansen, Henri ; Wagner, Jakob Birkedal et al.
2018. Abstract from Electron Backscatter Diffraction Topical Conference 2018 , Ann Arbor, Michigan, United States.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

TY - ABST

T1 - Use of elevated temperature in-situ transmission Kikuchi diffraction for the study of ultra-thin metal films

AU - Todeschini, Matteo

AU - Jansen, Henri

AU - Wagner, Jakob Birkedal

AU - Bastos da Silva Fanta, Alice

PY - 2018

Y1 - 2018

M3 - Conference abstract for conference

T2 - Electron Backscatter Diffraction Topical Conference 2018

Y2 - 23 May 2018 through 25 May 2018

ER -