Abstract
Surface x-ray diffraction has been used to study the growth of thin Cu films on Ni(001). We give direct evidence for the formation of embedded wedges with internal {111} facets in the film, as recently suggested by Muller et al. [Phys. Rev. Lett. 76, 2358 (1996)]. The unusual strain distribution within the wedges is determined and provides an explanation to the observed sudden change in growth and film morphology around 20 monolayers.
Original language | English |
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Journal | Physical Review Letters |
Volume | 79 |
Issue number | 22 |
Pages (from-to) | 4413-4416 |
ISSN | 0031-9007 |
DOIs | |
Publication status | Published - 1997 |