Unusual strain relaxation in Cu thin films on Ni(001)

F.B. Rasmussen, J. Baker, M. Nielsen, R. Feidenhans'l, R.L. Johnson

    Research output: Contribution to journalJournal articleResearch


    Surface x-ray diffraction has been used to study the growth of thin Cu films on Ni(001). We give direct evidence for the formation of embedded wedges with internal {111} facets in the film, as recently suggested by Muller et al. [Phys. Rev. Lett. 76, 2358 (1996)]. The unusual strain distribution within the wedges is determined and provides an explanation to the observed sudden change in growth and film morphology around 20 monolayers.
    Original languageEnglish
    JournalPhysical Review Letters
    Issue number22
    Pages (from-to)4413-4416
    Publication statusPublished - 1997


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