Abstract
This study investigates particle governed thermal stability in lamellar-nanostructured Al–1.0%Si using in-situ transmission electron microscopy and post-mortem observations. Microstructural coarsening, dominated by Y-junction motion, is correlated with dispersed Si nanoparticles. Si particles within lamellae efficiently hinder dislocation movement during deformation, fostering a configuration with Si particles along incidental dislocation boundaries (IDBs). This particle–IDB configuration significantly impedes Y-junction motion, retarding lamellar coarsening. The enhanced pinning force from particle–IDB synergy, combined with direct pinning by Si particles, contributes to improved thermal stability in lamellar-nanostructured Al–1.0%Si.
Original language | English |
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Journal | Materials Research Letters |
Volume | 12 |
Issue number | 3 |
Pages (from-to) | 208-216 |
ISSN | 2166-3831 |
DOIs | |
Publication status | Published - 2024 |
Keywords
- In-situ transmission electron microscopy
- interconnecting incidental dislocation boundary
- Lamellar-nanostructured Al alloys
- nanoparticle
- Significant breakthrough in fundamental materials science
- thermal stability