Uncertainty Estimation in SiGe HBT Small-Signal Modeling

Syed M. Masood, Tom Keinicke Johansen, Jens Vidkjær, Viktor Krozer

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Abstract

An uncertainty estimation and sensitivity analysis is performed on multi-step de-embedding for SiGe HBT small-signal modeling. The uncertainty estimation in combination with uncertainty model for deviation in measured S-parameters, quantifies the possible error value in de-embedded two-port parameters (Y and Z - parameters). The analysis is applied to a 0.35 μm 60 GHz fT SiGe HBT in frequency range 45 MHz to 26 GHz.
Original languageEnglish
Title of host publication2005 European Gallium Arsenide and other Compound Semiconductors Application Symposium
PublisherIEEE
Publication date2005
ISBN (Print)88-902012-0-7
Publication statusPublished - 2005
EventEuropean Gallium Arsenide and Other Semiconductor Application Symposium - Paris, France
Duration: 3 Oct 20054 Oct 2005
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10684

Conference

ConferenceEuropean Gallium Arsenide and Other Semiconductor Application Symposium
CountryFrance
CityParis
Period03/10/200504/10/2005
Internet address

Bibliographical note

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