Uncertainty Estimation in SiGe HBT Small-Signal Modeling

Syed M. Masood, Tom Keinicke Johansen, Jens Vidkjær, Viktor Krozer

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    Abstract

    An uncertainty estimation and sensitivity analysis is performed on multi-step de-embedding for SiGe HBT small-signal modeling. The uncertainty estimation in combination with uncertainty model for deviation in measured S-parameters, quantifies the possible error value in de-embedded two-port parameters (Y and Z - parameters). The analysis is applied to a 0.35 μm 60 GHz fT SiGe HBT in frequency range 45 MHz to 26 GHz.
    Original languageEnglish
    Title of host publication2005 European Gallium Arsenide and other Compound Semiconductors Application Symposium
    PublisherIEEE
    Publication date2005
    ISBN (Print)88-902012-0-7
    Publication statusPublished - 2005
    EventEuropean Gallium Arsenide and Other Semiconductor Application Symposium - Paris, France
    Duration: 3 Oct 20054 Oct 2005
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10684

    Conference

    ConferenceEuropean Gallium Arsenide and Other Semiconductor Application Symposium
    Country/TerritoryFrance
    CityParis
    Period03/10/200504/10/2005
    Internet address

    Bibliographical note

    Copyright: 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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