UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas

Codrina Ionita; Roman W. Schrittwieser; Guosheng Xu; Ning Yan; Huiqian Wang; Volker Naulin; Jens Juul Rasmussen; Doris Steinmuller-Nethl

doi:10.1109/ICEAA57318.2023.10297684

UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas

Codrina Ionita^*
, Roman W. Schrittwieser
, Guosheng Xu
, Ning Yan
, Huiqian Wang
, Volker Naulin
, Jens Juul Rasmussen
, Doris Steinmuller-Nethl

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review

Abstract

Plasma probes are simple and inexpensive diagnostic tools which now are used even in hot and hazardous plasmas, where, however, especially the probe casings, often consisting of graphite, might suffer from sputtering, evaporation and chemical reactions between plasma particles and the probe material. An additional detrimental effect frequently detected is that the sputtered-off electrically conductive graphite re-deposits on the boron nitride material usually used for electrical isolation of the probe pins, leading to unwanted and possibly dangerous shunts to ground and/or to adjacent probes, or even short circuits.

Original language	English
Title of host publication	Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023
Number of pages	1
Publisher	Institute of Electrical and Electronics Engineers Inc.
Publication date	2023
Pages	416-416
ISBN (Electronic)	979-8-3503-2058-9
DOIs	https://doi.org/10.1109/ICEAA57318.2023.10297684
Publication status	Published - 2023
Event	25th International Conference on Electromagnetics in Advanced Applications - Venice, Italy Duration: 9 Oct 2023 → 13 Oct 2023 Conference number: 25

Conference

Conference	25th International Conference on Electromagnetics in Advanced Applications
Number	25
Country/Territory	Italy
City	Venice
Period	09/10/2023 → 13/10/2023

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10.1109/ICEAA57318.2023.10297684

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Ionita, C., Schrittwieser, R. W., Xu, G., Yan, N., Wang, H., Naulin, V., Rasmussen, J. J., & Steinmuller-Nethl, D. (2023). UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas. In Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023 (pp. 416-416). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEAA57318.2023.10297684

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title = "UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas",

abstract = "Plasma probes are simple and inexpensive diagnostic tools which now are used even in hot and hazardous plasmas, where, however, especially the probe casings, often consisting of graphite, might suffer from sputtering, evaporation and chemical reactions between plasma particles and the probe material. An additional detrimental effect frequently detected is that the sputtered-off electrically conductive graphite re-deposits on the boron nitride material usually used for electrical isolation of the probe pins, leading to unwanted and possibly dangerous shunts to ground and/or to adjacent probes, or even short circuits.",

author = "Codrina Ionita and Schrittwieser, \{Roman W.\} and Guosheng Xu and Ning Yan and Huiqian Wang and Volker Naulin and Rasmussen, \{Jens Juul\} and Doris Steinmuller-Nethl",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 25th International Conference on Electromagnetics in Advanced Applications, ICEAA 2023 ; Conference date: 09-10-2023 Through 13-10-2023",

year = "2023",

doi = "10.1109/ICEAA57318.2023.10297684",

language = "English",

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booktitle = "Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023",

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Ionita, C, Schrittwieser, RW, Xu, G, Yan, N, Wang, H, Naulin, V , Rasmussen, JJ & Steinmuller-Nethl, D 2023, UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas. in Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023. Institute of Electrical and Electronics Engineers Inc., pp. 416-416, 25th International Conference on Electromagnetics in Advanced Applications, Venice, Italy, 09/10/2023. https://doi.org/10.1109/ICEAA57318.2023.10297684

UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas. / Ionita, Codrina; Schrittwieser, Roman W.; Xu, Guosheng et al.
Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023. Institute of Electrical and Electronics Engineers Inc., 2023. p. 416-416.

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review

TY - ABST

T1 - UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas

AU - Ionita, Codrina

AU - Schrittwieser, Roman W.

AU - Xu, Guosheng

AU - Yan, Ning

AU - Wang, Huiqian

AU - Naulin, Volker

AU - Rasmussen, Jens Juul

AU - Steinmuller-Nethl, Doris

N1 - Conference code: 25

PY - 2023

Y1 - 2023

N2 - Plasma probes are simple and inexpensive diagnostic tools which now are used even in hot and hazardous plasmas, where, however, especially the probe casings, often consisting of graphite, might suffer from sputtering, evaporation and chemical reactions between plasma particles and the probe material. An additional detrimental effect frequently detected is that the sputtered-off electrically conductive graphite re-deposits on the boron nitride material usually used for electrical isolation of the probe pins, leading to unwanted and possibly dangerous shunts to ground and/or to adjacent probes, or even short circuits.

AB - Plasma probes are simple and inexpensive diagnostic tools which now are used even in hot and hazardous plasmas, where, however, especially the probe casings, often consisting of graphite, might suffer from sputtering, evaporation and chemical reactions between plasma particles and the probe material. An additional detrimental effect frequently detected is that the sputtered-off electrically conductive graphite re-deposits on the boron nitride material usually used for electrical isolation of the probe pins, leading to unwanted and possibly dangerous shunts to ground and/or to adjacent probes, or even short circuits.

U2 - 10.1109/ICEAA57318.2023.10297684

DO - 10.1109/ICEAA57318.2023.10297684

M3 - Conference abstract in proceedings

AN - SCOPUS:85178220649

SP - 416

EP - 416

BT - Proceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 25th International Conference on Electromagnetics in Advanced Applications

Y2 - 9 October 2023 through 13 October 2023

ER -

UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas

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