UNCD-Armoured Probes for Diagnostics in Hot and Hazardous Plasmas

Codrina Ionita*, Roman W. Schrittwieser, Guosheng Xu, Ning Yan, Huiqian Wang, Volker Naulin, Jens Juul Rasmussen, Doris Steinmuller-Nethl

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

Abstract

Plasma probes are simple and inexpensive diagnostic tools which now are used even in hot and hazardous plasmas, where, however, especially the probe casings, often consisting of graphite, might suffer from sputtering, evaporation and chemical reactions between plasma particles and the probe material. An additional detrimental effect frequently detected is that the sputtered-off electrically conductive graphite re-deposits on the boron nitride material usually used for electrical isolation of the probe pins, leading to unwanted and possibly dangerous shunts to ground and/or to adjacent probes, or even short circuits.

Original languageEnglish
Title of host publicationProceedings of 2023 International Conference on Electromagnetics in Advanced Applications, ICEAA 2023
Number of pages1
PublisherInstitute of Electrical and Electronics Engineers Inc.
Publication date2023
Pages416-416
ISBN (Electronic)979-8-3503-2058-9
DOIs
Publication statusPublished - 2023
Event25th International Conference on Electromagnetics in Advanced Applications - Venice, Italy
Duration: 9 Oct 202313 Oct 2023
Conference number: 25

Conference

Conference25th International Conference on Electromagnetics in Advanced Applications
Number25
Country/TerritoryItaly
CityVenice
Period09/10/202313/10/2023

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