Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter H. Nguyen, Christopher Rathje, Graham J. Hornig, Haille M. Sharum, James R. Hoffman, Mark R. Freeman, Frank A. Hegmann

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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