Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter H. Nguyen, Christopher Rathje, Graham J. Hornig, Haille M. Sharum, James R. Hoffman, Mark R. Freeman, Frank A. Hegmann

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.
Original languageEnglish
Title of host publicationFrontiers in Optics 2016
Number of pages2
PublisherOptical Society of America (OSA)
Publication date2016
Article numberFF3F.2
ISBN (Print)978-1-943580-19-4
Publication statusPublished - 2016
EventFrontiers in Optics 2016 - Rochester Riverside Convention Center, Rochester, NY, United States
Duration: 17 Oct 201621 Oct 2016


ConferenceFrontiers in Optics 2016
LocationRochester Riverside Convention Center
CountryUnited States
CityRochester, NY
Internet address
SeriesOptics Infobase Conference Papers

Bibliographical note

From the session: Ultrafast Dynamics and Laser Ion Acceleration (FF3F)


  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Atoms
  • Atomic resolution
  • Non equilibrium
  • Picoseconds
  • Silicon surfaces
  • Single atoms
  • Spatio-temporal resolution
  • Sub nanometers
  • Tunneling phenomena
  • Scanning tunneling microscopy

Cite this

Jelic, V., Iwaszczuk, K., Nguyen, P. H., Rathje, C., Hornig, G. J., Sharum, H. M., ... Hegmann, F. A. (2016). Ultrafast terahertz scanning tunneling microscopy with atomic resolution. In Frontiers in Optics 2016 [FF3F.2] Optical Society of America (OSA). Optics Infobase Conference Papers https://doi.org/10.1364/FIO.2016.FF3F.2