Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter H. Nguyen, Christopher Rathje, Graham J. Hornig, Haille M. Sharum, James R. Hoffman, Mark R. Freeman, Frank A. Hegmann

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


    We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.
    Original languageEnglish
    Title of host publicationFrontiers in Optics 2016
    Number of pages2
    PublisherOptical Society of America (OSA)
    Publication date2016
    Article numberFF3F.2
    ISBN (Print)978-1-943580-19-4
    Publication statusPublished - 2016
    EventFrontiers in Optics 2016 - Rochester Riverside Convention Center, Rochester, NY, United States
    Duration: 17 Oct 201621 Oct 2016


    ConferenceFrontiers in Optics 2016
    LocationRochester Riverside Convention Center
    Country/TerritoryUnited States
    CityRochester, NY
    Internet address
    SeriesOptics Infobase Conference Papers

    Bibliographical note

    From the session: Ultrafast Dynamics and Laser Ion Acceleration (FF3F)


    • Electronic, Optical and Magnetic Materials
    • Mechanics of Materials
    • Atoms
    • Atomic resolution
    • Non equilibrium
    • Picoseconds
    • Silicon surfaces
    • Single atoms
    • Spatio-temporal resolution
    • Sub nanometers
    • Tunneling phenomena
    • Scanning tunneling microscopy


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