Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Vedran Jelic; Krzysztof Iwaszczuk; Peter H. Nguyen; Christopher Rathje; Graham J. Hornig; Haille M. Sharum; James R. Hoffman; Mark R. Freeman; Frank A. Hegmann

doi:10.1364/FIO.2016.FF3F.2

Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter H. Nguyen, Christopher Rathje, Graham J. Hornig, Haille M. Sharum, James R. Hoffman, Mark R. Freeman, Frank A. Hegmann

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.

Original language	English
Title of host publication	Frontiers in Optics 2016
Number of pages	2
Publisher	Optical Society of America (OSA)
Publication date	2016
Article number	FF3F.2
ISBN (Print)	978-1-943580-19-4
DOIs	https://doi.org/10.1364/FIO.2016.FF3F.2
Publication status	Published - 2016
Event	Frontiers in Optics 2016 - Rochester Riverside Convention Center, Rochester, NY, United States Duration: 17 Oct 2016 → 21 Oct 2016 http://www.frontiersinoptics.com/

Conference

Conference	Frontiers in Optics 2016
Location	Rochester Riverside Convention Center
Country/Territory	United States
City	Rochester, NY
Period	17/10/2016 → 21/10/2016
Internet address	http://www.frontiersinoptics.com/

Series	Optics Infobase Conference Papers
ISSN	2162-2701

Bibliographical note

From the session: Ultrafast Dynamics and Laser Ion Acceleration (FF3F)

Keywords

Electronic, Optical and Magnetic Materials
Mechanics of Materials
Atoms
Atomic resolution
Non equilibrium
Picoseconds
Silicon surfaces
Single atoms
Spatio-temporal resolution
Sub nanometers
Tunneling phenomena
Scanning tunneling microscopy

Access to Document

10.1364/FIO.2016.FF3F.2

OpenUrl availability

Full text

Cite this

@inproceedings{1f5fbfe8ecb3490d8970b3faca4f6093,

title = "Ultrafast terahertz scanning tunneling microscopy with atomic resolution",

abstract = "We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.",

keywords = "Electronic, Optical and Magnetic Materials, Mechanics of Materials, Atoms, Atomic resolution, Non equilibrium, Picoseconds, Silicon surfaces, Single atoms, Spatio-temporal resolution, Sub nanometers, Tunneling phenomena, Scanning tunneling microscopy",

author = "Vedran Jelic and Krzysztof Iwaszczuk and Nguyen, {Peter H.} and Christopher Rathje and Hornig, {Graham J.} and Sharum, {Haille M.} and Hoffman, {James R.} and Freeman, {Mark R.} and Hegmann, {Frank A.}",

note = "From the session: Ultrafast Dynamics and Laser Ion Acceleration (FF3F); Frontiers in Optics 2016, FiO16 ; Conference date: 17-10-2016 Through 21-10-2016",

year = "2016",

doi = "10.1364/FIO.2016.FF3F.2",

language = "English",

isbn = "978-1-943580-19-4",

series = "Optics Infobase Conference Papers",

booktitle = "Frontiers in Optics 2016",

publisher = "Optical Society of America (OSA)",

url = "http://www.frontiersinoptics.com/",

}

Jelic, V, Iwaszczuk, K, Nguyen, PH, Rathje, C, Hornig, GJ, Sharum, HM, Hoffman, JR, Freeman, MR & Hegmann, FA 2016, Ultrafast terahertz scanning tunneling microscopy with atomic resolution. in Frontiers in Optics 2016., FF3F.2, Optical Society of America (OSA), Optics Infobase Conference Papers, Frontiers in Optics 2016, Rochester, NY, United States, 17/10/2016. https://doi.org/10.1364/FIO.2016.FF3F.2

TY - GEN

T1 - Ultrafast terahertz scanning tunneling microscopy with atomic resolution

AU - Jelic, Vedran

AU - Iwaszczuk, Krzysztof

AU - Nguyen, Peter H.

AU - Rathje, Christopher

AU - Hornig, Graham J.

AU - Sharum, Haille M.

AU - Hoffman, James R.

AU - Freeman, Mark R.

AU - Hegmann, Frank A.

N1 - From the session: Ultrafast Dynamics and Laser Ion Acceleration (FF3F)

PY - 2016

Y1 - 2016

N2 - We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.

AB - We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.

KW - Electronic, Optical and Magnetic Materials

KW - Mechanics of Materials

KW - Atoms

KW - Atomic resolution

KW - Non equilibrium

KW - Picoseconds

KW - Silicon surfaces

KW - Single atoms

KW - Spatio-temporal resolution

KW - Sub nanometers

KW - Tunneling phenomena

KW - Scanning tunneling microscopy

U2 - 10.1364/FIO.2016.FF3F.2

DO - 10.1364/FIO.2016.FF3F.2

M3 - Article in proceedings

SN - 978-1-943580-19-4

T3 - Optics Infobase Conference Papers

BT - Frontiers in Optics 2016

PB - Optical Society of America (OSA)

T2 - Frontiers in Optics 2016

Y2 - 17 October 2016 through 21 October 2016

ER -

Ultrafast terahertz scanning tunneling microscopy with atomic resolution

Abstract

Conference

Bibliographical note

Keywords

Access to Document

OpenUrl availability

Fingerprint

Cite this