Abstract
We use time-resolved THz spectroscopy and transient optical absorption spectroscopy as two complementary techniques to study ultrafast carrier dynamics in silicon nanocrystal thin films. We find that the photoconductive dynamics in these materials is dominated by interface trapping, and we observe several different relaxation mechanisms for photoexcited carriers
Original language | English |
---|---|
Publication date | 2009 |
Publication status | Published - 2009 |
Event | International Workshop on Optical Terahertz Science and Technology - Santa Barbara, CA, United States Duration: 7 Mar 2009 → 11 Mar 2009 |
Workshop
Workshop | International Workshop on Optical Terahertz Science and Technology |
---|---|
Country/Territory | United States |
City | Santa Barbara, CA |
Period | 07/03/2009 → 11/03/2009 |